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Instructor:
Dr. Edward F. Kelley has been involved in display
measurements since 1992. He worked at NIST on display metrology from
1992 through 2009 and participated in a number of standards
organizations (ICDM, VESA, ISO, SAE, IEC, EIA, CIE, AAPM). He serves as
the editor of the upcoming new measurement standard of the ICDM
(International Committee for Display Metrology) as well as one of its
main authors. He has
over
100 publications including 13 published courses and seminars on display
metrology given to international audiences for the SID (Society for
Information
Display of which he is a fellow) and elsewhere. (To check Ed Kelley
out, perform a web search on "Kelley displays NIST" without the
quotes.)
THREE-DAY
COURSE:
This course is designed to make you aware of the problems
that we encounter when we try to measure electronic displays. Many
think that it is a simple matter to characterize a display. That is not
usually the case. There are many pitfalls and problems that can lead to
huge errors in obtaining good measurement results. When this course was
offered at NIST, we had laboratories in which to conduct experiments.
Those experiments have been converted to detailed 3D computer models to
simulate the experiments and are explained in detail during the course.
Spreadsheets are supplied to enable in-house utilization of these
methods. The advantages are that the course is no longer bound to a
laboratory location and we can review the experiments in detail making
sure that all fully understand their impact. During the three-day
course there is plenty of time for questions and discussion.
Lecture
Topics:
- RADIATION, LIGHT, & COLOR
- Radiometry
- Photometry
- Colorimetry
- MEASUREMENTS OF LIGHT
- Detectors
- Uncertainty
- Stray-Light Management
- Small-Area Measurements
- Calibrations & Diagnostics
- SETUP OF DISPLAY
- Visual Assessment
- Setup and Adjustment
- Laboratory Alignment
- TYPES OF DISPLAY METRICS
- Fundamental
- Gray & Color Scales
- Spatial
- Uniformity
- Viewing-Angle
- Temporal
- (Reflection is separated out below.)
- Motion
- Physical, Mechanical, Electrical
- Front Projector
- Front-Projection Screen
- 3D & Stereo
- NED & HMD Diagnostics
- Composite Metrics
- REFLECTION
- Canonical Reflection Terminology
- Reflection Measurements
Note that the lecture material is
subject to
change as needed.
Technical
accessories kit
available
for
$500.
(Retail
value
more
than
$1500.) This kit is being
made
available optionally; we will need a month's notification if the
kits are wanted. The kit is not needed for the course; it is provided
for your own use at your facility. Students who don't purchase the kit
will be provided with a printed copy of the presentation and either a
USB drive or an FTP site with the presentation in PDF along with the
spreadsheets. Windows® software (e.g.
Excel®) is
featured, but should run in emulation modes on other platforms.
- ICDM new standard (if not available, we will supply the
VESA FPDM2
at the time of the course and then send you the new ICDM DMS when it
becomes available).
- DisplayMate® USB memory stick containing software for
generating test patterns in the native resolution of the computer
display to which it is attached (for 32-bit Windows® platform,
Windows®
simulation mode on other platforms), see: http://www.displaymate.com/advanced.html.
- Detailed laboratory spreadsheets,
presentation materials (PDF), and other files for your reference on the
USB
memory stick included with the DisplayMate software.

- White
reflectance standard (uncalibrated).
 
- Reflection
samples
(75
mm
X
75
mm,
uncalibrated)
similar
to
display
surfaces
for
studying
the
various
reflection
properties
of
displays:
Lambertian,
haze,
specular,
and their possible combinations
(includes a black-glass sample).

- Flashlight
for
quick
inspection
of
reflection
properties.

- Hard
copy
of lecture presentation (B&W, close to 600 slides in the
presentation).
Updated 20100312T0541
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