DISPLAY METROLOGY
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Instructor: Dr. Edward F. Kelley has been involved in display measurements since 1992. He worked at NIST on display metrology from 1992 through 2009 and participated in a number of standards organizations (ICDM, VESA, ISO, SAE, IEC, EIA, CIE, AAPM). He serves as the editor of the upcoming new measurement standard of the ICDM (International Committee for Display Metrology) as well as one of its main authors.  He has over 100 publications including 13 published courses and seminars on display metrology given to international audiences for the SID (Society for Information Display of which he is a fellow) and elsewhere. (To check Ed Kelley out, perform a web search on "Kelley displays NIST" without the quotes.)

THREE-DAY COURSE:
This course is designed to make you aware of the problems that we encounter when we try to measure electronic displays. Many think that it is a simple matter to characterize a display. That is not usually the case. There are many pitfalls and problems that can lead to huge errors in obtaining good measurement results. When this course was offered at NIST, we had laboratories in which to conduct experiments. Those experiments have been converted to detailed 3D computer models to simulate the experiments and are explained in detail during the course. Spreadsheets are supplied to enable in-house utilization of these methods. The advantages are that the course is no longer bound to a laboratory location and we can review the experiments in detail making sure that all fully understand their impact. During the three-day course there is plenty of time for questions and discussion.

Lecture Topics:

  • RADIATION, LIGHT, & COLOR
    • Radiometry
    • Photometry
    • Colorimetry
  • MEASUREMENTS OF LIGHT
    • Detectors
    • Uncertainty
    • Stray-Light Management
    • Small-Area Measurements
    • Calibrations & Diagnostics
  • SETUP OF DISPLAY
    • Visual Assessment
    • Setup and Adjustment
    • Laboratory Alignment
  • TYPES OF DISPLAY METRICS
    • Fundamental
    • Gray & Color Scales
    • Spatial
    • Uniformity
    • Viewing-Angle
    • Temporal
    • (Reflection is separated out below.)
    • Motion
    • Physical, Mechanical, Electrical
    • Front Projector
    • Front-Projection Screen
    • 3D & Stereo
    • NED & HMD Diagnostics
    • Composite Metrics
  • REFLECTION
    • Canonical Reflection Terminology
    • Reflection Measurements

Note that the lecture material is subject to change as needed.

Technical accessories kit available for $500. (Retail value more than $1500.) This kit is being made available optionally; we will need a month's notification if the kits are wanted. The kit is not needed for the course; it is provided for your own use at your facility. Students who don't purchase the kit will be provided with a printed copy of the presentation and either a USB drive or an FTP site with the presentation in PDF along with the spreadsheets. Windows® software (e.g. Excel®) is featured, but should run in emulation modes on other platforms.

  • ICDM new standard (if not available, we will supply the VESA FPDM2 at the time of the course and then send you the new ICDM DMS when it becomes available).
  • DisplayMate® USB memory stick containing software for generating test patterns in the native resolution of the computer display to which it is attached (for 32-bit Windows® platform, Windows® simulation mode on other platforms), see: http://www.displaymate.com/advanced.html.
  • Detailed laboratory spreadsheets, presentation materials (PDF), and other files for your reference on the USB memory stick included with the DisplayMate software.
  • White reflectance standard (uncalibrated).
  • Reflection samples (75 mm X 75 mm, uncalibrated) similar to display surfaces for studying the various reflection properties of displays: Lambertian, haze, specular, and their possible combinations (includes a black-glass sample).
  • Flashlight for quick inspection of reflection properties.
  • Hard copy of lecture presentation (B&W, close to 600 slides in the presentation).

Updated 20100312T0541