THIS IS HOME FOR KELTEK, LLC., IN LONGMONT, COLORADO, U.S.A.

KELTEK, LLC Edward F. Kelley, Ph.D. Consulting Physicist ed@keltekresearch.com
Click Here for: Display Metrology Short Course Learn the intricacies of making good measurements by understanding the problems that readily arise.
Display Measurement Laboratory
(Spectroradiometer courtesy Photo Research)
MAIN LABORATORY DARKROOM The laboratory is designed to be flexible in order to accommodate virtually any measurement on any commercial display technology that is required. We retain a spectroradiometric measurement capability (courtesy Photo Research, Inc.) for general display measurements: full-screen and box, luminance, color, correlated color temperature (CCT), viewing angle, gamma, etc. Alignment of our apparatus is achieved by a laser whereby we routinely obtain alignment with the display normal to within one or two minutes of arc whenever necessary. The laboratory is constantly being enhanced with more capabilities. We specialize in reflection measurements on displays whereby we can replicate most reflection apparatus required. We have integrating spheres, sampling spheres, discrete and collimated sources all available for reflection characterization of displays and the measurement of contrasts and colors under ambient conditions. We measure reflectance factors, reflectances, character contrasts and character reflectances  under ambient conditions (specular included or excluded, photometric or radiometric measurements as needed). FUTURE DIRECTIONS We intend to improve and increase our measurement capabilities including bidirectional reflectance distribution function (BRDF) measurements (both photometric and spectroradiometric), temporal measurements, matrix-scatter characterization, projection measurements, motion-artifact measurements, and 3D measurements.
RESEARCH EXPERIENCE: Display Metrology at NIST (1992-2009 ) Research with NIST and University Teaching (1989-1992) Liquid Dielectrics & Electrical Breakdown at NIST (1977-1989)        HV Pulse Measurements, High-Speed Photography        (at High Magnification), and Dielectric Breakdown
KELTEK began in 1989 as a sole proprietorship when Ed first left NIST. He continued to work with NIST via personal services contracts for a while and looking into university teaching. He returned to NIST in 1992 where he started the Flat Panel Display Laboratory that ultimately became the Display Metrology Project, a work that continued for 17 years. (KELTEK went dormant as long as Ed worked at NIST.) KELTEK revived after Ed's retirement from NIST in 2009. Ed will continue his passion for quality display metrology in teaching the Display Metrology Short Course, doing research in display measurements, and providing commercial-display measurements for customers.
Certain commercial equipment, instruments, materials, systems, software, and trade names may be identified throughout this site in order to specify or identify technologies adequately. Such identification is not intended to imply recommendation or endorsement by KELTEK, nor is it intended to imply that the systems or products identified are necessarily the best available for the purpose.
© KELTEK, LLC. All the contents of this web page and the KELTEK web pages to which it links are the property of KELTEK, LLC. Do not copy, etc., any item without written permission from KELTEK; contact ed@keltekresearch.com. Thanks, --Ed.
Updated 200810T1238